Main function:

For Devices, Circuits & Parts of Digital, Power, Analog, Hybrid & Photoelectric

    l Experiments of Single Event Upset, Single Event Latch-up, Single Event Burnout & Single Event Transient

    l Validation Testing of Single Event Effect Hardening Design

    l Measurements of LET Threshold & Cross-section

    l 2D & 3D Scanning of Sensitive Volume for Single Event Effect

    l Time Resolved Testing of Devices & Circuits for Single Event Effect

Major capability:

    l  Laser Equivalent LET：0.5-120MeV.cm2/mg

    l  Spot Size: <2μm

    l  Scanning Resolution: <2μm

    l  Laser Wavelength: 1064nm

    l  Laser Pulse Width: <25ps