Main function:
For Devices, Circuits & Parts of Digital, Power, Analog, Hybrid & Photoelectric
Experiments of Single Event Upset, Single Event Latch-up, Single Event Burnout & Single Event Transient
Validation Testing of Single Event Effect Hardening Design
Measurements of LET Threshold & Cross-section
Major capability:
LET: 42-45MeV.cm?/mg
Fission Particle Flux: 1×104/cm2.s