Recently,  entrusted by a unit, our lab has evaluated the single event effects of  hardness assurance performance of the domestic aerospace electronic  devices by our self-developed pulsed laser single event effects  experimental device. The results showed: the hardness assurance chip to  single event upset capacity has been improved significantly - threshold  increased by one order of magnitude, the saturation cross-section  reduced by three orders of magnitude. The reinforced chip has not yet  occurred Latchup phenomenon until the laser energy comes to the maximum  (corresponding to the heavy ion LET value). While the Latchup phenomenon  of non-reinforced chip in 4% of the experimental maximum laser energy  begin to appear. Pulsed laser experimental facility of single event  effects test is fast, targeted, and very useful for the domestic  aerospace electronic devices. It plays an important role of reference  and guidance for domestic aerospace electronic devices design.

    Fig.1 The scenarios of single event effects test by pulsed laser for domestic aerospace electronic devices.

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    Fig.2 The results of single event effects test by pulsed laser for domestic aerospace electronic devices.