Our  Researchers had successfully developed pulsed laser Single Event  Effects (SEE) experimental device based on independent technology. This  device can simulate SEE induced by heavy ion with equivalent value, and  it can also implement accurate scan test of the chip. Using this device  we firstly execute the international test of multiple SEL effects on  device and circuits used in Satellites. At the same time, through the  persistent pulsed laser radiation the device would maintain the  performance of multiple micros SEL effects with current increasing,  voltage drooping, and other series of circuit response.
  This  phenomenon can be used for the research of SEE mechanism with different  technology level or working condition of devices and circuits. It’s  proved that the special effects of this phenomenon are more destructive  in the application of aerospace engineering which should be focused on  in the intensive study.

Figure The increasing current and drooping voltage caused by multiple SEL effects on device and circuits.