After  Pulsed Laser Single Event Effects Facility(PLSEEF) has been  successfully established, our researchers firstly investigated the  hardened 64K SRAM and 8Bit MCU based on SOI processes,. whose threshold  of Single Event Upset (SEU) was obtained and analyzed. After then,  cooperating with Sichuan Institute of Solid Circiuts of China  Electronics Technology Group Corporation, our lab has been the  contractor of Chongqing funded project “Research on Susceptivity of  Single Event Effects for General Operation Amplifier”. And the Single  Event Transient (SET) of analog and optoelectronic devices used in space  mission has been tested. Recently, the abnormal phenomena of a  satellite in orbit have been absolutely tested with PLSEEF on ground,  the critical experimental results for analyzing and diagnosing the  abnormity were supported.

The SET Cross Section vs. the equivalent LET of HCPL-5231