Recently,  entrusted by an institute of Chinese Academy of Sciences, we have  evaluated the single event effects of the application special integrated  circuitby single event effect pulsed laser experimental facility.

Single event latch-up effect  and Single event transient effect were observed. We measured the  latch-up equivalent LET threshold  and located the areas sensitive to SEL.

Pulsed  laser experimental facility can be used to efficiently assess single  event effect for designed chips. It provides targeted experimental data  for chip optimized design. Accordingly, the chip development cycle would  be shortened efficiently.